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Upcoming Scheduled Courses

015 RF Design and Simulation of Wireless Systems

Location: Gothenburg, Sweden
Date: June 22 – June 26, 2026
Duration: 5 days

020 Advanced Course on Image Sensor Technology

Location: Barcelona, Spain
Date: April 13 – April 15, 2026
Duration: 3 days

023 Satellite Communication Systems

Location: Amersfoort, The Netherlands
Date: May 19 – May 22, 2026
Duration: 4 days

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Semiconductors Technology

Course 856 Alternative Lithography

Dr. Uzodinma Okoroanyanwu is teaching this 2-day course, which gives an overview of alternative lithographic technologies, including imprint lithography; colloidal

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Semiconductors Technology

Course 857 Optical Lithography

Dr. Uzodinma Okoroanyanwu is teaching this 4-day course on Optical Lithography. Optical lithography, also called photolithography, can be described as

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Communication / Quantum Networks

Course 860 Bluetooth Low Energy – Technology, Trends and Applications

Mr. Naresh Gupta, Author – Inside Bluetooth Low Energy, is the instructor for this 5-day course in Bluetooth Low Energy.

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Battery Technology

Course 870 Invention and Innovation – Creation and Management of World Class Patents

Dr. Walter Lange, is teaching this two-day class focusing on the fundamentals to enable successful creation of Technology Patents. This

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Semiconductors Technology

Course 880 Wafer Fab Process Technology

This intensive 4-day course, instructed by Mr. Jim Fraser, provides a broad overview of silicon wafer fab processing, with in-depth

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Sensors and Digital Imaging

e-Course 601 – Introduction to Correlated and Uncorrelated Noise in Imagers

Professor Albert J.P Theuwissen, Delft University of Technology, the Netherlands, Harvest Imaging, Belgium. Introduction to Correlated and Uncorrelated Noise in

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Sensors and Digital Imaging

E-Course 601-603 Advanced e- Course in Image Sensors and Digital Cameras

Professor Albert J.P Theuwissen, Delft University of Technology, the Netherlands, Harvest Imaging, Belgium is teaching this bundle e-learning course in

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Sensors and Digital Imaging

e-Course 602 – Characterization of Noise in Dark

Professor Albert J.P Theuwissen, Delft University of Technology, the Netherlands, Harvest Imaging, Belgium. Characterization of Noise in Dark It may

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Sensors and Digital Imaging

e-Course 603 – Characterization of Noise with Light

Professor Albert J.P Theuwissen, Delft University of Technology, the Netherlands, Harvest Imaging, Belgium. Characterization of Noise with Light In the

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