e-Course 601 – Introduction to Correlated and Uncorrelated Noise in Imagers

Professor Albert J.P Theuwissen, Delft University of Technology, the Netherlands, Harvest Imaging, Belgium. Introduction to Correlated and Uncorrelated Noise in Imagers In the introduction of the course, the difference between Correlated and Uncorrelated Noise will be explained. In a first instance, one can put all fixed-pattern noise sources or noise in the spatial domain under the header of Correlated Noise, and one can put all temporal noise sources or noise in the time domain under the header of Uncorrelated Noise. The course includes: 42 minutes on-demand video 9 modules 3 months access This introductory course is the first part of a series of three e-Learning courses about Image Sensors. For effective training benefit, we recommend also attending course 602 Characterization of Noise in Dark and course 603 Characterization of Noise with Light.

Available course dates

This course has no planned course dates.

If you are interested in this course, contact us at cei@cei.se

E-Learning Courses, Sensors and Digital Imaging

E-Course 601 Introduction to Correlated and Uncorrelated Noise in Imagers

Location: E-Course 3 months access

Instructor: Professor Albert J.P Theuwissen

Introduction to Correlated and Uncorrelated Noise in Imagers In the introduction of the course, the difference between Correlated and Uncorrelated Noise will be explained.  In a first instance, one can put all fixed-pattern noise sources or noise in the spatial domain under the header of Correlated Noise, and one can put all temporal noise sources or noise in the time domain under the header of Uncorrelated Noise. The course includes:
  • 42 minutes on-demand video
  • 9 modules
  • 3 months access
This introductory course is the first part of a series of three e-Learning courses about Image Sensors. For effective training benefit, we recommend also attending course 602 Characterization of Noise in Dark and course 603 Characterization of Noise with Light. Get a better price when ordering all three courses: Bundle 601-603 Advanced Course in Image Sensors and Digital Cameras

95,00 
 

TECHNOLOGY FOCUS

CMOS image sensors are becoming more and more complicated. In the mid-nineties the devices were simple image sensors, but over the recent years they have become complete camera systems.

Characterization and evaluation of these highly sophisticated SoC’s (system-on-chip) is no longer straightforward.

Furthermore the pixels of the sensors are becoming extremely small and their limited size can have negative effects on dynamic range, light sensitivity, noise and speed.

In the context of further optimization of the imaging functionality, it is of great importance to have a good understanding of performance-limiting parameters of the system. These can only be revealed by performing dedicated measurements on the image sensors and/or on the complete camera systems.

Instructor

Professor Albert J.P Theuwissen

COURSE CONTENT

In the introduction of the course, the difference between correlated and uncorrelated noise will be explained. In a first instance, one can put all fixed-pattern noise sources or noise in the spatial domain under the header of correlated noise, and one can put all temporal noise sources or noise in the time domain under the header of uncorrelated noise.

Both types of noise, correlated and uncorrelated, are part of the complete pallet of noise sources present in an image sensor. It is very important to understand the difference between these two categories of noise, because statistical operations (averaging and standard deviation) will have a different impact on these noise sources. And the specific effects of averaging and standard deviation calculation on these noise sources will allow us to separate the correlated noise from the uncorrelated noise in images taken by the imager-under-test. In its turn this is very important to get an idea of where exactly in the image sensor the noise is being generated.

The theory about the effect of averaging and standard deviation calculation on the various types of noise will be illustrated by means of real images taken by a commercially available camera. Two great advantages of the tools explained are :

  • There is no need to know what is inside the camera
  • No absolute measurements have to be done

WHO SHOULD ATTEND

This e-Learning course is intended for engineers that already have some experience in the field 

1. First assignment Uncorrelated noise
2. Measurement procedure
3. Theory uncorrelated noise
4. Theory Correlated Noise
5. Averaging and Fixed Pattern Noise Calculation
6. Results Average Signal
7. Results Total Noise
8. ”Seeing is believing” Comparing Images
9. Conclusion

ALL COURSE DATES FOR THE CATEGORY:

Sensors and Digital Imaging

014 Digital Camera Systems

Location: Brussels, Belgium Date: September 29 - October 2, 2026 Duration: 4 days
Instructor: Professor Albert J.P Theuwissen Digital cameras are an essential part of our daily life, e.g. in mobile phones, camcorders, digital photography, cars, and in imaging applications for medical, industrial and broadcasting. This 4-day course is developed to provide theoretical familiarity and hands-on experience with digital cameras and associated topics with focus on the overall system aspects. The complete path will be discussed from “photons in” to “digital numbers out”. The effect of light sources, optics, imagers, defects, and data processing will be covered. Read full course description including course schedule

Early Bird
2 940,00 3 265,00 
Early Bird Price Ends: July 29, 2026

Sensors and Digital Imaging

020 Advanced Course on Image Sensor Technology

Location: Barcelona, Spain Date: April 13 - April 15, 2026 Duration: 3 days
Instructor: Professor Albert J.P Theuwissen Highly sophisticated CMOS image sensors are key components of modern cameras. Technology as well as device architectures are optimized to obtain peak performance of the image sensor and the camera system. The most advanced CMOS image sensors show pixel sizes beyond 1 µm. The imagers demonstrate a light sensitivity comparable to that of the human eye. This course is intended for the specialists in the field. A very good background of digital imaging is needed to get the most out of this course. Read full course description including course schedule

Early Bird
2 280,00 2 535,00 
Early Bird Price Ends: February 13, 2026

Sensors and Digital Imaging

063 Advanced Optical Sensors: From Detectors to ASIC Integration with Edge AI and Functional Safety Considerations

Location: Barcelona, Spain Date: April 13, 2026 - April 16, 2026 Duration: 4 days

Instructor: Dr. Farzad Parsaie

Optical sensors are evolving toward intelligence, downsizing, and multi-functionality, with critical roles in functional safety applications like autonomous driving, industrial automation, and medical diagnostics. Artificial Intelligence (AI) is enhancing optical sensor performance by improving data processing, signal-to-noise ratios, and handling dynamic scenarios, essential for high-fidelity measurements in these fields. This course covers these advancements, from photodetector fundamentals to ASIC integration and interfacing, with a focus on Edge AI and Functional Safety. Read full course description including course schedule

Early Bird
2 940,00 3 265,00 
Early Bird Price Ends: February 13, 2026

Sensors and Digital Imaging

063 Advanced Optical Sensors: From Detectors to ASIC Integration with Edge AI and Functional Safety Considerations

Location: Amersfoort, The Netherlands Date: May 18 - May 21, 2026 Duration: 4 days
Instructor: Dr. Farzad Parsaie Optical sensors are evolving toward intelligence, downsizing, and multi-functionality, with critical roles in functional safety applications like autonomous driving, industrial automation, and medical diagnostics. Artificial Intelligence (AI) is enhancing optical sensor performance by improving data processing, signal-to-noise ratios, and handling dynamic scenarios, essential for high-fidelity measurements in these fields. This course covers these advancements, from photodetector fundamentals to ASIC integration and interfacing, with a focus on Edge AI and Functional Safety. Read full course description including course schedule

Early Bird
2 940,00 3 265,00 
Early Bird Price Ends: March 18, 2026

Sensors and Digital Imaging

063 Advanced Optical Sensors: From Detectors to ASIC Integration with Edge AI and Functional Safety Considerations

Location: Gothenburg, Sweden Date: June 22 - June 25, 2026 Duration: 4 days
Instructor: Dr. Farzad Parsaie Optical sensors are evolving toward intelligence, downsizing, and multi-functionality, with critical roles in functional safety applications like autonomous driving, industrial automation, and medical diagnostics. Artificial Intelligence (AI) is enhancing optical sensor performance by improving data processing, signal-to-noise ratios, and handling dynamic scenarios, essential for high-fidelity measurements in these fields. This course covers these advancements, from photodetector fundamentals to ASIC integration and interfacing, with a focus on Edge AI and Functional Safety. Read full course description including course schedule

Early Bird
2 940,00 3 265,00 
Early Bird Price Ends: April 22, 2026

Sensors and Digital Imaging

835 A 360-degree View of the Sensors for Industrial Applications – Focusing on the Inductive Sensors

Location: Gothenburg, Sweden Date: June 22 - June 26, 2026 Duration: 5 days
Instructor: Dr. Sorin Fericean This 5-day course on how to get familiar and experienced with the extremely large types and versions of sensors for industrial applications.

He is a new instructor of the CEI-Europe and is a professional expert on the subject of design and manufacturing of electronic sensors and ASIC designing, testing, and release for such products. After more than 25 years with one of the 10 global players on the field of industrial sensors – Balluff GmbH Company, Germany – he is currently as a freelancer in his consulting office FerSensC / Leonberg, Germany, carrying out sensor design projects and consulting.

Read full course description including course schedule

Early Bird
3 540,00 3 935,00 
Early Bird Price Ends: April 22, 2026

E-Learning Courses, Sensors and Digital Imaging

E-Course 601 Introduction to Correlated and Uncorrelated Noise in Imagers

Location: E-Course 3 months access

Instructor: Professor Albert J.P Theuwissen

Introduction to Correlated and Uncorrelated Noise in Imagers In the introduction of the course, the difference between Correlated and Uncorrelated Noise will be explained.  In a first instance, one can put all fixed-pattern noise sources or noise in the spatial domain under the header of Correlated Noise, and one can put all temporal noise sources or noise in the time domain under the header of Uncorrelated Noise. The course includes:
  • 42 minutes on-demand video
  • 9 modules
  • 3 months access
This introductory course is the first part of a series of three e-Learning courses about Image Sensors. For effective training benefit, we recommend also attending course 602 Characterization of Noise in Dark and course 603 Characterization of Noise with Light. Get a better price when ordering all three courses: Bundle 601-603 Advanced Course in Image Sensors and Digital Cameras

95,00 
 

E-Learning Courses, Sensors and Digital Imaging

E-Course 602 Characterization of Noise in Dark

Location: E-Course 3 months access

Instructor: Professor Albert J.P Theuwissen

Characterization of Noise in Dark It may sound strange that an image sensor, which is made to capture light, will be characterized first in dark conditions.  But actually this should not really be surprising because noise will first become visible in the darkest parts of an image.  For that reason the dark performance of an image sensor plays crucial role.  It also sets the lower end of the dynamic range…… The course includes:
  • 116 minutes on-demand video
  • 37 modules
  • 3 months access
This course is the second part of a series of three e-Learning courses about Image Sensors. For effective training benefit, we recommend also attending course 601 Introduction to Correlated and Uncorrelated Noise in Imagers and course 603 Characterization of Noise with Light. Get a better price when ordering all three courses: Bundle 601-603 Advanced Course in Image Sensors and Digital Cameras

199,00 
 

E-Learning Courses, Sensors and Digital Imaging

E-Course 603 Characterization of Noise with Light

Location: E-Course 3 months access

Instructor: Professor Albert J.P Theuwissen 

Characterization of Noise with Light In the third and last part of the course, the image sensor will be characterized with light input. First the fixed-pattern noise (= correlated noise) will be measured, and next the temporal noise (= uncorrelated noise) will be characterized. All measurements will be based on an existing camera and with uniform light input. For both noise types, correlated and uncorrelated, some extra statistical operations will allow to split the overall noise characterized into a contribution on row level, on column level and on pixel level. This gives very useful information on where to find the root cause of the noise sources. The course includes:
  • 126 minutes on-demand video
  • 34 modules
  • 3 months access
This course is the third part of a series of three e-Learning courses about Image Sensors. For effective training benefit, we recommend also attending course 601 Introduction to Correlated and Uncorrelated Noise in Imagers and course 602 Characterization of Noise in Dark. Get a better price when ordering all three courses: Bundle 601-603 Advanced Course in Image Sensors and Digital Cameras

199,00 
 

E-Learning Courses, Sensors and Digital Imaging

E-Course Bundle 601-603 Advanced course in image sensors and digital cameras

Location: E-Course 12 months access

Instructor: Professor Albert J.P Theuwissen

The course includes:
  • 284 minutes on-demand video
  • 80 modules
  • 12 months access
Part 1 – Introduction to Correlated and Uncorrelated Noise in Imagers In the introduction of the course, the difference between Correlated and Uncorrelated Noise will be explained.  In a first instance, one can put all fixed-pattern noise sources or noise in the spatial domain under the header of Correlated Noise, and one can put all temporal noise sources or noise in the time domain under the header of Uncorrelated Noise. Part 2 – Characterization of Noise in Dark It may sound strange that an image sensor, which is made to capture light, will be characterized first in dark conditions.  But actually this should not really be surprising because noise will first become visible in the darkest parts of an image.  For that reason the dark performance of an image sensor plays crucial role.  It also sets the lower end of the dynamic range. Part 3 – Characterization of Noise with Light In the third and last part of the course, the image sensor will be characterized with light input. First the fixed-pattern noise (= correlated noise) will be measured, and next the temporal noise (= uncorrelated noise) will be characterized. All measurements will be based on an existing camera and with uniform light input. For both noise types, correlated and uncorrelated, some extra statistical operations will allow to split the overall noise characterized into a contribution on row level, on column level and on pixel level. This gives very useful information on where to find the root cause of the noise sources. Read full course description including course schedule.

Early Bird
450,00 493,00 

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