075 Heterogeneous integration of chiplets – Defect inspection, metrology and failure analysis

Instructor: Dr. Ehrenfried Zschech

Expand your knowledge of the processing, materials, performance, and reliability aspects of heterogeneous integration of chiplets. Let Professor Zschech guide you all the way from 3D advanced packaging technologies through fault isolation and failure analysis up to the kinetics of degradation processes and reliability challenges. This course will include novel aspects of high-performance computing and AI applications that are driving the demand for increased functionality, performance, and reliability.

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075 Heterogeneous integration of chiplets – Defect inspection, metrology and failure analysis

Location: Amersfoort, The Netherlands
Date: May 18 – May 20, 2026
Duration: 3 days

Reserve your seat today – booking confirmation sent by email.

Payment requested when the course is approved to run as planned. 

Early Bird
2 280,00 2 535,00 
Early Bird Price Ends: March 18, 2026

075 Heterogeneous integration of chiplets – Defect inspection, metrology and failure analysis

Reserve your seat today – booking confirmation sent by email.
 
Payment requested when the course is approved to run as planned. 

Reserve a Seat

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