Professor Albert J.P Theuwissen

Professor at the Delft University of Technology, the Netherlands and CEO of Harvest Imaging, Belgium. Dr. Theuwissen has been teaching in more than 100 courses for us since year 1999. In 2013 he received the Exceptional Service Award of IISS and in 2014 the SEMI Award. Dr. Theuwissen has been a member of the Continuing Education Institute-Europe Faculty since 1999.

About

Dr. Theuwissen received his M.Sc (1977) and his Ph.D. (1983) degree in electrical engineering from the Catholic University of Leuven, Belgium.

In the ESAT laboratory he focused on semiconductor technology for linear CCD image sensors. From 1983 till 2002 he was involved in research in the field of solid-state image sensing, SDTV- and HDTV-imagers, CCD as well as CMOS solid-state image activities at Philips Research Laboratories in Eindhoven, the Netherlands. From 2001 till 2023 Dr. Albert Theuwissen joined the Delft University of Technology as part-time professor and in 2002 he joined DALSA Corp. to act first as the company’s Chief Technology Officer and later as the Chief Scientist of DALSA Semiconductors.

In 2007 Dr. Theuwissen founded Harvest Imaging and since then he is fully focusing on training, coaching and consulting in the field of solid-state imaging technology.

Dr. Theuwissen is the author or co-author of many technical papers in the solid-state imaging field, has issued several patents, authored a textbook “Solid-State Imaging with Charge-Coupled Devices” in 1995, and been appointed an IEEE distinguished lecturer. He is the founder of the Walter Kosonocky Award, which highlights the best technical paper in the field of solid-state image sensors. He was general chair of the International Image Sensor Workshop in 1997, 2003, 2009 and 2015. Since 1998 he has served as a member of the Technical Program Committee of ISSCC, and in 2010 he was Chair of the International Technical Program Committee of ISSCC. Dr. Theuwissen is an IEEE Fellow. In 2008 he also received the Fuji Gold Medal for his research, development and education work in the field of solid-state imaging. Furthermore, Dr. Theuwissen was elected Electronic Imaging Scientist 2011 at the Electronic Imaging conference held in San Francisco, USA. In 2013 he received the Exceptional Service Award of IISS and in 2014 the SEMI Award.  From 2017 till 2021 he was the president of the International Image Sensor Society, which is a non-profit organization that he founded in 2007 together with his peer Nobukazu Teranishi and Prof. Eric Fossum.

Dr. Theuwissen has been a member of the CEI-Europe Faculty since 1999, and completed over 100 courses for CEI-Europe.

Dr. Theuwissen has a digital imaging blog, see: http://harvestimaging.com/blog/

All Courses By Professor Albert J.P Theuwissen

Course 004 Hands-on Characterization of Solid-State Image Sensors

Professor Albert J.P Theuwissen; Delft University of Technology, the Netherlands and Harvest Imaging, Belgium is the instructor for this advanced

Course 013 Digital Imaging: Image Capturing, Image Sensors – Technologies and Applications

Professor Albert J.P Theuwissen, Harvest Imaging, Belgium, is the instructor for this 4-days course in how to get familiar with

Course 014 Digital Camera Systems

Professor Albert J.P Theuwissen, Harvest Imaging, Belgium is the instructor of this 4-day course in Digtal Camera Systems. Digital cameras

Course 020 Advanced Course on Image Sensor Technology

Professor Albert J.P Theuwissen, Delft University of Technology, the Netherlands and Harvest Imaging, Belgium, is teaching this 3-day advanced course

e-Course 601 – Introduction to Correlated and Uncorrelated Noise in Imagers

Professor Albert J.P Theuwissen, Delft University of Technology, the Netherlands, Harvest Imaging, Belgium. Introduction to Correlated and Uncorrelated Noise in

E-Course 601-603 Advanced e- Course in Image Sensors and Digital Cameras

Professor Albert J.P Theuwissen, Delft University of Technology, the Netherlands, Harvest Imaging, Belgium is teaching this bundle e-learning course in

e-Course 602 – Characterization of Noise in Dark

Professor Albert J.P Theuwissen, Delft University of Technology, the Netherlands, Harvest Imaging, Belgium. Characterization of Noise in Dark It may

e-Course 603 – Characterization of Noise with Light

Professor Albert J.P Theuwissen, Delft University of Technology, the Netherlands, Harvest Imaging, Belgium. Characterization of Noise with Light In the

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